X-ray diffraction analysis of SnO2 films prepared by oxidation of tin films
- 1 March 1983
- journal article
- research article
- Published by Elsevier in Thin Solid Films
- Vol. 101 (2) , L33-L34
- https://doi.org/10.1016/0040-6090(83)90271-7
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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- Preparation of Thick Crystalline Films of Tin Oxide and Porous Glass Partially Filled with Tin OxideJournal of the Electrochemical Society, 1969