Laser Speckle Metrology
- 14 October 1971
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 25, 149-156
- https://doi.org/10.1117/12.953505
Abstract
During the past three years several methods have been found for extracting useful information from laser speckle patterns, either visually or by photographic or photoelectric correlation techniques. Speckle interferometers can be used to detect movement or vibration, or to measure inplane strain of a loaded specimen. It is possible that they can be used for desensitised comparison of a succession of diffusely reflecting components against a master shape. As an example of a noninterferometric speckle device, a visual surface depth probe will be considered.© (1971) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.Keywords
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