Solid films and layers deposited on silicon — a versatile infrared sampling technique

• 1 July 1992
• journal article
• research article
• Published by Elsevier in Vibrational Spectroscopy
• Vol. 3  (4) , 327-330
• https://doi.org/10.1016/0924-2031(92)85011-o

Abstract

Keywords

• INFRARED SPECTROMETRY
• SPECTROPHOTOMETRY
• SILICON DISCS