New detection method of hot-carrier degradation using photon spectrum analysis of weak luminescence on CMOS VLSI

Publisher Website

1 January 1990

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/icmts.1990.67894

Abstract

No abstract available

Keywords

This publication has 4 references indexed in Scilit:

Evaluation technique of gate oxide reliability with electrical and optical measurements
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
A study of photon emission from n-channel MOSFET's
IEEE Transactions on Electron Devices, 1987
Analysis of Product Hot Electron Problems by Gated Emission Microscopy
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1986
Photon Emission from Avalanche Breakdown in Silicon
Physical Review B, 1956