Continuous Ion Source for a Time-of-Flight Mass Spectrometer

1 December 1963

journal article
research article
Published by AIP Publishing in Review of Scientific Instruments

Vol. 34 (12) , 1367-1370
https://doi.org/10.1063/1.1718238

Abstract

With simple modifications improved performance of continuous ion sources in a time of flight mass spectrometer has been obtained. The system was developed for use with heated filament surface ionization sources; however, the advantages of its use with an electron bombardment source seem more significant. With an electron gun operating continuously, a factor of 300 increase in sensitivity over that of the pulsed mode of operation is attained with improved resolution and no increase in the ratio of noise to signal.

Keywords

MASS SPECTROMETERS
IONIZATION
VELOCITY
HEATING
SURFACES
INSTRUMENTATION
SENSITIVITY
NOISE
OPERATION
SIGNALS

This publication has 1 reference indexed in Scilit:

THE CHEMISTRY OF URANIUM IN SURFACE IONIZATION SOURCES¹
The Journal of Physical Chemistry, 1962