A Characterisation of Titanium Passivation Films by In-Situ AC Impedance Measurements and XPS Analysis
- 1 August 1995
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 192-194, 177-184
- https://doi.org/10.4028/www.scientific.net/msf.192-194.177
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: