Wideband monitoring and measuring system for optical coatings
- 15 July 1989
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 28 (14) , 2889-2894
- https://doi.org/10.1364/ao.28.002889
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 5 references indexed in Scilit:
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- Inhomogeneity in films: limitation of the accuracy of optical monitoring of thin filmsApplied Optics, 1981
- Wideband optical monitoring of nonquarterwave multilayer filtersApplied Optics, 1979
- Nonquarterwave multilayer filters: optical monitoring with a minicomputer allowing correction of thickness errorsApplied Optics, 1979
- Optical monitoring of nonquarterwave multilayer filtersApplied Optics, 1978