Stress effect on cycle properties of the silicon thin-film anode

• 1 July 2001
• journal article
• Published by Elsevier in Journal of Power Sources
• Vol. 97-98, 191-193
• https://doi.org/10.1016/s0378-7753(01)00761-3

Abstract

Keywords

• SI THIN-FILM ANODE
• MICROBATTERY
• STRESS MEASUREMENT