Electric field intensity variation in the vicinity of a perfectly conducting conical probe: Application to near-field microscopy
- 5 June 1998
- journal article
- research article
- Published by Wiley in Microwave and Optical Technology Letters
- Vol. 18 (2) , 120-124
- https://doi.org/10.1002/(sici)1098-2760(19980605)18:2<120::aid-mop10>3.0.co;2-b
Abstract
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