USE OF ASYMMETRIC DIFFRACTION IN X-RAY TOPOGRAPHY TO REVEAL INTERFACIAL STRAIN
- 15 August 1970
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 17 (4) , 149-150
- https://doi.org/10.1063/1.1653343
Abstract
Perimeters only of thin films have heretofore been observed on crystal substrates by x‐ray topography. It has been found that the entire film/crystal interface can be exhibited in like fashion if asymmetric diffraction is used to produce the topograph.Keywords
This publication has 1 reference indexed in Scilit:
- Contrast Asymmetries in Lang Topographs of Crystals Strained by Thin FilmsPhysica Status Solidi (b), 1968