Investigation of strong electric-field induced surface phenomena by soft X–UV laser interferometry
- 1 October 1998
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 416 (1) , 189-191
- https://doi.org/10.1016/s0168-9002(98)00753-0
Abstract
No abstract availableKeywords
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