Influence of the desorption and growth temperatures on the crystalline quality of molecular-beam epitaxy InAlAs layers

Abstract
The influence of molecular-beam epitaxy growth conditions, especially oxide desorption and growth temperature, on the final quality of InAlAs layers grown on (100) InP substrates, has been analyzed by conventional and high-resolution transmission electron microscopy observations. InP thermal cleaning prior growth at 500 °C has been found to produce rough interfaces and extended defects which propagate up to the surface, while thermal cleaning at 530 °C results in abrupt interfaces and improved epilayer structure. The increase of growth temperature up to 530 °C, also improves the crystalline quality of InAlAs.

This publication has 0 references indexed in Scilit: