Effect of annealing temperature on TiO2 monolayer thin films as studied by waveguide raman spectroscopy and electron microscopy
- 1 January 1992
- journal article
- research article
- Published by Springer Nature in Journal of Materials Science Letters
- Vol. 11 (12) , 875-877
- https://doi.org/10.1007/bf00730492
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Fabrication of tapers and lenslike waveguides by a microcontrolled dip coating procedureApplied Optics, 1988
- Standardization and control of a dip-coating procedure for optical thin films prepared from solutionCanadian Journal of Physics, 1988
- Reduction of substrate interference in Raman spectroscopy of submicron titania coatingsApplied Optics, 1984
- Fabrication of planar dielectric waveguides with high optical damage thresholdIEEE Journal of Quantum Electronics, 1983
- Embossing technique for fabricating integrated optical components in hard inorganic waveguiding materialsOptics Letters, 1983
- Structural characterization of TiO_2 optical coatings by Raman spectroscopyApplied Optics, 1983
- Optical interference coatings prepared from solutionApplied Optics, 1981
- Effect of hydrostatic pressure on the Raman spectrum of anatase (TiO2)Solid State Communications, 1979
- Raman scattering of thin films as a waveguideOptics Communications, 1974
- Measurement of Thin Film Parameters with a Prism CouplerApplied Optics, 1973