Dynamic characterisation of high-speed latchingcomparators

2 March 2000

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 36 (5) , 402-404
https://doi.org/10.1049/el:20000369

Abstract

The internal noise of latching comparators is a critical parameter in high-speed A/D converters. A new noise measurement technique utilising a noise voltage-to-output frequency conversion approach is presented. The advantages of this technique are increased accuracy, bandwidth and ease of use.

Keywords

DYNAMIC CHARACTERISATION
NOISE MEASUREMENT TECHNIQUE
HIGH-SPEED LATCHING COMPARATORS
NOISE VOLTAGE-TO-OUTPUT FREQUENCY CONVERSION
HIGH-SPEED ADC
A/D CONVERTER
INTERNAL NOISE

This publication has 2 references indexed in Scilit:

Noise estimation in strobed comparators
Electronics Letters, 1997
An 8-bit 200-MHz BiCMOS comparator
IEEE Journal of Solid-State Circuits, 1990