Use of Thermoelectronic Emission for Studying Point Defects in Refractory Oxides
- 1 November 1975
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 58 (11-12) , 493-497
- https://doi.org/10.1111/j.1151-2916.1975.tb18766.x
Abstract
No abstract availableKeywords
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