Structure of pyrolytic and sputtered SiO2 films by X-ray Fourier analysis
- 16 May 1970
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 2 (1) , 137-141
- https://doi.org/10.1002/pssa.19700020117
Abstract
No abstract availableKeywords
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