Versatile plasma probe
- 1 May 1975
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 46 (5) , 592-598
- https://doi.org/10.1063/1.1134271
Abstract
We have developed a plasma probe circuit which couples standard Langmuir probe diagnostic procedures with pulse mode operation. Circuit versatility provides the means for studying time-dependent phenomena and establishes an improved capability for measuring plasma density and temperature. As an application of our circuit, we show that pulse mode operation substantially reduces the time variance of electrode surface conditions which often causes hysteresis in the Langmuir probe current–voltage characteristic.Keywords
This publication has 4 references indexed in Scilit:
- A Critical Study on the Reliability of Electron Temperature Measurements with a Langmuir ProbeJournal of geomagnetism and geoelectricity, 1972
- Reliability of Probe Measurements in Hot Cathode Gas DiodesJournal of Applied Physics, 1952
- Einflusz von änderungen des sondenzustandes auf sondencharakteristiken nach langmuirPhysica, 1938
- The Theory of Collectors in Gaseous DischargesPhysical Review B, 1926