Multifactor-surface-tests of organic insulating materials in the early stage of degradation
- 24 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 1, 296-299
- https://doi.org/10.1109/elinsl.1996.549340
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Some fundamentals on multifactor surface aging mechanisms of different epoxy resin systemsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Experience with the merry-go-round testIEEE Transactions on Electrical Insulation, 1990