Applications of atomic force microscopy to structural characterization of organic thin films
- 1 December 1994
- journal article
- Published by Elsevier in Colloids and Surfaces A: Physicochemical and Engineering Aspects
- Vol. 93, 305-333
- https://doi.org/10.1016/0927-7757(94)80002-2
Abstract
No abstract availableKeywords
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