X-ray reflectivity study of temperature-dependent surface layering in liquid Hg
- 15 November 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 58 (20) , R13419-R13422
- https://doi.org/10.1103/physrevb.58.r13419
Abstract
We report x-ray reflectivity measurements of liquid mercury between -36 °C and +25 °C. The surface structure can be described by a layered density profile convolved with a thermal roughness The layering has a spacing of 2.72 Å and an exponential decay length of 5.0 Å. Surprisingly, is found to increase considerably faster with temperature than the behavior predicted by capillary wave theory, in contrast with previous measurements on Ga and dielectric liquids.
Keywords
This publication has 14 references indexed in Scilit:
- Structure of the liquid–vapor interface of a Sn:Ga alloyThe Journal of Chemical Physics, 1997
- Elastic and other associated properties ofPhysical Review B, 1997
- Capillary-wave roughening of surface-induced layering in liquid galliumPhysical Review B, 1996
- Structure of the liquid-vapor interfaces of metals and binary alloysJournal of Non-Crystalline Solids, 1996
- X-ray studies of atomic layering at liquid metal surfacesJournal of Non-Crystalline Solids, 1996
- Surface segregation and layering in the liquid–vapor interface of a dilute bismuth:gallium alloyThe Journal of Chemical Physics, 1996
- Surface Layering in Liquid Gallium: An X-Ray Reflectivity StudyPhysical Review Letters, 1995
- X-Ray Reflectivity Measurements of Surface Layering in Liquid MercuryPhysical Review Letters, 1995
- Capillary waves on the surface of simple liquids measured by x-ray reflectivityPhysical Review A, 1988
- An experimental study of the in-plane distribution of atoms in the liquid–vapor interface of mercuryThe Journal of Chemical Physics, 1987