Failure distributions of shock models

1 September 1980

journal article
Published by Cambridge University Press (CUP) in Journal of Applied Probability

Vol. 17 (3) , 745-752
https://doi.org/10.2307/3212968

Abstract

A single device shock model is studied. The device is subject to some damage process. Under the assumption that as the cumulative damage increases, the probability that any additional damage will cause failure increases, we find sufficient conditions on the shocking process so that the life distribution will be increasing failure rate.

Keywords

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