Avalanche multiplication in InAs photodiodes

• 1 January 1965
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 53  (2) , 180
• https://doi.org/10.1109/PROC.1965.3606

Abstract

Keywords

• PHOTODIODES
• DIODES
• VOLTAGE
• LASER MODES
• INTRUSION DETECTION
• PHOTOCONDUCTIVITY
• TUNNELING
• MONITORING
• PREAMPLIFIERS
• NOISE LEVEL