Caracterisation et comparaison par spectroscopie Auger et diffraction d'electrons lents de surfaces de silicium monocristallin, amorphe et hydrogene
- 31 March 1980
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 4 (2) , 221-233
- https://doi.org/10.1016/0378-5963(80)90131-2
Abstract
No abstract availableKeywords
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