X-ray Observation of Conversion of Faulted Loops to Prismatic Loops in Silicon

• 1 May 1976
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 15  (5) , 917-918
• https://doi.org/10.1143/jjap.15.917

Abstract

Keywords

• FAULTED LOOPS
• RAY OBSERVATION
• LOOPS IN SILICON
• OBSERVATION OF CONVERSION
• CONVERSION OF FAULTED
• LOOPS TO PRISMATIC