XPS analysis of chemically etched II–VI semiconductor surfaces
- 1 July 1996
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 100-101, 652-655
- https://doi.org/10.1016/0169-4332(96)00357-1
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Initial and final state effects in the ESCA spectra of cadmium and silver oxidesThe Journal of Chemical Physics, 1977
- Bond ionicity and structural stability of some average-valence-five materials studied by x-ray photoemissionPhysical Review B, 1977
- Electronic relaxation processes in the KLL′ auger spectra of the free magnesium atom, solid magnesium and MgOJournal of Electron Spectroscopy and Related Phenomena, 1977