Site-Specific FIB Preparation of Atom Probe Samples
- 1 August 2004
- journal article
- Published by Oxford University Press (OUP) in Microscopy and Microanalysis
- Vol. 10 (S02) , 1150-1151
- https://doi.org/10.1017/s1431927604883193
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.Keywords
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