Quantification of atom-probe FIM data and an application to the investigation of surface segregation of alloys
- 1 June 1978
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 32 (11) , 778-780
- https://doi.org/10.1063/1.89892
Abstract
It is shown that the atom‐probe field‐ion‐microscope data does not give directly the true composition of a sample. A method is devised for converting the data to the true composition. We also report here the first ToF atom‐probe study of surface segregation of Pt–5% Ru and Pt–8% W alloys. Using the new analysis the true composition depth profiles of the alloys are obtained with a single atomic layer resolution.Keywords
This publication has 9 references indexed in Scilit:
- TOF atom-probe investigation of metal oxidesJournal of Applied Physics, 1978
- Prediction of Segregation to Alloy Surfaces from Bulk Phase DiagramsPhysical Review Letters, 1976
- Aiming performance of the atom probeReview of Scientific Instruments, 1975
- Surface segregation in alloysJournal of Catalysis, 1975
- Energy deficits in pulsed field evaporation and deficit compensated atom-probe designsReview of Scientific Instruments, 1974
- An FIM-atom probe study of the precipitation of copper from lron-1.4 at. pct copper. Part I: Field-ion microscopyMetallurgical Transactions, 1973
- Photoelectric investigation of the surface composition of equilibrated Pt$z.sbnd;Ru alloy films in ultrahigh vacuum and in the presence of CO*1Journal of Catalysis, 1972
- FIM-atom probe analysis of thin nitride platelets in Fe-3 at.% MoScripta Metallurgica, 1971
- The Atom-Probe Field Ion MicroscopeReview of Scientific Instruments, 1968