The role of interface states in the evaluation of density of states from field effect measurements in dc-sputtered a-Si:H
- 1 December 1985
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 77-78, 311-314
- https://doi.org/10.1016/0022-3093(85)90663-5
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Field effect in dc-sputtered a-Si:H in structure using SiNx prepared in situJournal of Non-Crystalline Solids, 1985