Reduction of spurious deformation in electron microscope thin foils
- 1 February 1976
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 9 (2) , 83-84
- https://doi.org/10.1088/0022-3735/9/2/001
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A method of mapping defects in thin foilsMicron (1969), 1973
- A simple method of obtaining discs for electron microscopyJournal of Physics E: Scientific Instruments, 1973