The characterization of annealing in thin metal films using the Mayadas-Shatzkes theory

Publisher Website

1 June 1977

journal article
Published by Elsevier in Thin Solid Films

Vol. 43 (3) , 343-348
https://doi.org/10.1016/0040-6090(77)90297-8

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Exact and approximate equations for the thickness dependence of resistivity and its temperature coefficient in thin polycrystalline metal films
Thin Solid Films, 1973
Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces
Physical Review B, 1970