QUALITY IMPROVEMENT FOR RC06 CHIP RESISTOR

• 1 November 1996
• journal article
• research article
• Published by Wiley in Quality and Reliability Engineering International
• Vol. 12  (6) , 439-445
• https://doi.org/10.1002/(sici)1099-1638(199611)12:6<439::aid-qre61>3.0.co;2-0

Abstract

Keywords

• CATEGORICAL DATA
• ANOVA
• TAGUCHI METHOD
• ACCUMULATION ANALYSIS
• SCORING SCHEME