Wetting in random systems

Complete wetting and critical wetting transitions are studied in d-dimensional systems with quenched random impurities and general interactions. New but more universal singular behavior is predicted: e.g., under random fields the wetting-layer thickness at complete wetting should diverge as ${\mathrm{h}}^{\mathrm{-}1/2}$ for d=3, where h measures the deviation from the bulk-phase boundary. Wetting exponents are expressed in terms of a single spatial anisotropy or roughness exponent, ζ, defined via ${\xi }_{\mathrm{\perp }}$∼${\xi }_{\mathrm{?}}^{\mathrm{\zeta }}$ where ${\xi }_{\mathrm{\perp }}$ and ${\xi }_{\mathrm{?}}$ are the wetting correlation lengths.