Current-controlled negative resistance in thin niobium oxide films

• 1 June 1963
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 51  (6) , 941-942
• https://doi.org/10.1109/proc.1963.2339

Abstract

Keywords

• NIOBIUM
• SUPERCONDUCTING FILMS
• ELECTRONS
• BREAKDOWN VOLTAGE
• SUPERCONDUCTING TRANSITION TEMPERATURE
• DIODES
• EQUATIONS
• GAS DISCHARGE DEVICES
• TRANSISTORS
• CURRENT-VOLTAGE CHARACTERISTICS