End-face scattering loss in integrated-optical waveguides

Abstract
An experimental technique to determine the end-face scattering loss in electro-optic polymer channel waveguides is presented. The technique combines the cut-back and the optimum end-fire coupling methods. A loss resulting from the scattering was a prominent source of waveguide coupling loss and was strongly dependent on the end-face roughness of the guiding and cladding layers induced by cleaving. With the use of our investigation methods, other losses could also be examined with ease and high reliability.