Combined process modeling and subthreshold device simulation
- 31 March 1986
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 29 (3) , 371-375
- https://doi.org/10.1016/0038-1101(86)90217-0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Two-dimensional computer simulation models for MOSLSI fabrication processesIEEE Transactions on Electron Devices, 1981
- Nonplanar VLSI device analysis using the solution of Poisson's equationIEEE Transactions on Electron Devices, 1980
- Iterative Solution of Implicit Approximations of Multidimensional Partial Differential EquationsSIAM Journal on Numerical Analysis, 1968