Total Dose Tfsting of Several Types of MOS Microprocessors

1 January 1978

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 25 (6) , 1649-1651
https://doi.org/10.1109/TNS.1978.4329588

Abstract

Three types of microprocessors, the 8008, the 8080A, and the 1802, were tested in an ionizing radiation environment. Failure levels ranged from a very low 700 rads(Si) to anproximately 7000 rads(Si). With proper choice of vendor and lot screening it may be possible to meet some system requirements with off-the-shelf parts.

Keywords

MICROPROCESSORS
TESTING
PERFORMANCE EVALUATION
IONIZING RADIATION
LARGE SCALE INTEGRATION
CLOCKS
STRESS
CMOS TECHNOLOGY
MANUFACTURING PROCESSES
PRODUCTION

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