Imaging crystal growth features using scanning force microscopy (SFM)
- 1 January 1994
- journal article
- Published by Wiley in Crystal Research and Technology
- Vol. 29 (7) , 1005-1011
- https://doi.org/10.1002/crat.2170290716
Abstract
Crystal growth features on stearic acid, potassium nitrate, and potash alum have been determined by means of scanning force microscopy (SFM). Structures like growth spirals, etch pits, 2D‐nuclei, and growth hillocks could be observed. The analysis of the face specific surface topographies leads to structures which correspond to those expected from kinetic measurements.Keywords
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