A corrected double-deflection electron spectrometer equipped with a parallel recording system

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1 April 1989

journal article
Published by Elsevier in Ultramicroscopy

Vol. 28 (1-4) , 190-200
https://doi.org/10.1016/0304-3991(89)90292-1

Abstract

No abstract available

Keywords

This publication has 5 references indexed in Scilit:

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Ultramicroscopy, 1989
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