The use of fourier analysis of the x-ray diffraction line profile for calculating the distribution function of crystallites according to dimensions in oriented linear polyethylene
- 31 December 1984
- journal article
- Published by Elsevier in Polymer Science U.S.S.R.
- Vol. 26 (2) , 440-448
- https://doi.org/10.1016/0032-3950(84)90126-6
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Fourier analysis of polymer x‐ray diffraction patternsJournal of Polymer Science: Polymer Physics Edition, 1979
- A study of the effects of annealing on the mechanical stiffness and structure of ultra high modulus linear polyethylenePolymer, 1979
- Crystallite size distribution and lattice distortions in uniaxially drawn polyethyleneJournal of Materials Science, 1976
- Crystallite size distribution and lattice distortions in polyethylene from analyses of Debye-Scherrer line profilesJournal of Applied Physics, 1973
- X-Ray Line Broadening in Isotactic PolystyreneJournal of Applied Physics, 1966
- Interpretation of line profiles by the Fourier method with special reference to the size distribution of carbon black crystallitesActa Crystallographica, 1961
- Raies de Debye–Scherrer et repartition des dimensions des domaines de Bragg dans les poudres polycristallinesActa Crystallographica, 1950
- A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction LinesJournal of Scientific Instruments, 1948