Diluted magnetic semiconductor superlattices for magnetic studies of dimensional crossover (invited)

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Abstract
Diluted magnetic semiconductor Cd1−xMnxTe‐CdTe superlattices with x=0.069, 0.13, 0.15, and 0.20 and various layer thicknesses were grown by molecular‐beam epitaxy for optical and magnetic studies of dimensional crossover. X‐ray diffraction patterns, low‐temperature photoluminescence spectra, and ac magnetic susceptibility measurements were used to verify the integrity of these structures. In particular, the magnetic studies showed the spin‐glass transition present in the thicker magnetic layers to broaden and eventually disappear with decreasing thickness, suggesting the inability of the two‐dimensional system to support long‐range spin‐glass order.