How much can you learn about thin adsorbed layers with optical techniques?
- 13 January 2008
- book chapter
- Published by Springer Nature
- p. 296-299
- https://doi.org/10.1007/bfb0118095
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Sensitivity of optical methods to the homogeneity of particulate layersThe Journal of Chemical Physics, 1998
- Validity of the Uniform Thin-Film Approximation for the Optical Analysis of Particulate FilmsLangmuir, 1997
- Characterization of Thin Protein Films through Scanning Angle ReflectometryLangmuir, 1997
- Optical characterization of thin films: Beyond the uniform layer modelThe Journal of Chemical Physics, 1996
- Adsorption of Charged Latex Particles on Mica Studied by Atomic Force MicroscopyJournal of Colloid and Interface Science, 1996
- Exchange Kinetics for a Heterogeneous Protein System on a Solid SurfaceLangmuir, 1995
- Optical Properties of Surfaces Covered with Latex Particles: Comparison with TheoryThe Journal of Physical Chemistry, 1995
- Optical properties of the fluid-fluid interfacePhysica A: Statistical Mechanics and its Applications, 1990
- Ellipsometry as a tool to study the adsorption behavior of synthetic and biopolymers at the air–water interfaceBiopolymers, 1978
- A phenomenological theory of the dielectric properties of thin filmsPhysica, 1973