Electrostatic discharge damage of MR heads
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 31 (6) , 2624-2626
- https://doi.org/10.1109/20.490073
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse VoltagesIEEE Transactions on Nuclear Science, 1968