Experiments concerning the life testing of semiconductor devices—II. Life testing of transistors in switching operation mode
- 1 April 1971
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 10 (2) , 75-93
- https://doi.org/10.1016/0026-2714(71)90499-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Experiments concerning the life testing of transistors—IMicroelectronics Reliability, 1971
- Life testing of semiconductor rectifiers with energy sparing synthetic circuitsMicroelectronics Reliability, 1969