Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance
- 23 October 2006
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 89 (17)
- https://doi.org/10.1063/1.2372581
Abstract
International audienceMicrocavities offering small modal volumes V_0.6 __/n_3 and consisting of two identical tapered Bragg mirrors etched into a monomode silicon-on-insulator ridge waveguide are studied for operation at telecommunications wavelengths. The authors have measured a Q factor of 8900, for a loaded cavity with a peak transmission at resonance in excess of 60%. The measured Q value quantitatively agrees with the calculation results and is 20 times larger than those previously reported for similar geometries without tapersKeywords
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