Voltammetry of undiluted redox systems backed by in-situ Raman spectroscopy. Evidence for strong accumulation of ions in the diffusion layer at microelectrode surface
- 1 May 2003
- journal article
- Published by Elsevier in Electrochemistry Communications
- Vol. 5 (5) , 412-415
- https://doi.org/10.1016/s1388-2481(03)00091-2
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