Observation of single minimum ionising particles with amorphous silicon diodes
- 1 August 1991
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 305 (3) , 512-516
- https://doi.org/10.1016/0168-9002(91)90150-o
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Effect of primary ionization in amorphous silicon detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- Signal, recombination effects and noise in amorphous silicon detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1987
- Detection of charged particles in amorphous silicon layersNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986