A Direct Method of Nonparametric Measurement Selection

1 September 1971

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. C-20 (9) , 1100-1103
https://doi.org/10.1109/t-c.1971.223410

Abstract

A direct method of measurement selection is proposed to determine the best subset of d measurements out of a set of D total measurements. The measurement subset evaluation procedure directly employs a nonparametric estimate of the probability of error given a finite design sample set. A suboptimum measurement subset search procedure is employed to reduce the number of subsets to be evaluated. Teh primary advantage of the approach is the direct but nonparametric evaluation of measurement subsets, for the M class problem.

Keywords

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