HIGH FREQUENCY WAFER PROBING AND POWER SUPPLY RESONANCE EFFECTS
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 1069
- https://doi.org/10.1109/test.1991.519776
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A novel 24-GHz bandwidth coaxial probeIEEE Transactions on Instrumentation and Measurement, 1990