Rapid microscale analyses with an external ion source Fourier transform ion cyclotron resonance mass spectrometer
- 1 December 1996
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 157-158, 391-403
- https://doi.org/10.1016/s0168-1176(96)04468-0
Abstract
No abstract availableKeywords
This publication has 35 references indexed in Scilit:
- High-resolution tandem FT mass spectrometry above 10 kDaAccounts of Chemical Research, 1994
- Detection of high mass-to-charge ions by Fourier transform mass spectrometryMass Spectrometry Reviews, 1994
- High mass resolution glow discharge mass spectrometry using an external ion source FT-ICR mass spectrometerAnalytical Chemistry, 1993
- Ultrahigh resolution matrix-assisted laser desorption/ionization of small proteins by Fourier-transform mass spectrometryAnalytical Chemistry, 1993
- Ultrahigh-resolution Fourier transform ion cyclotron resonance mass spectrometerReview of Scientific Instruments, 1993
- Fast neutral beam ion source coupled to a Fourier transform ion cyclotron resonance mass spectrometerReview of Scientific Instruments, 1991
- A high Pressure external ion source for fourier transform ion cyclotron resonance spectrometryInternational Journal of Mass Spectrometry and Ion Processes, 1990
- External ion source FTMS instrument for analysis of high mass ionsInternational Journal of Mass Spectrometry and Ion Processes, 1989
- Theory of Fourier transform ion cyclotron resonance mass spectroscopy. I. Fundamental equations and low-pressure line shapeThe Journal of Chemical Physics, 1976
- Fourier transform ion cyclotron resonance spectroscopyChemical Physics Letters, 1974