X-ray measurement of residual stresses in sintered silicon nitride.

• 1 January 1987
• journal article
• Published by Society of Materials Science, Japan in Journal of the Society of Materials Science, Japan
• Vol. 36  (407) , 817-822
• https://doi.org/10.2472/jsms.36.817

Abstract

Keywords

• RESIDUAL STRESSES
• SINTERED SILICON
• SILICON NITRIDE
• X RAY MEASUREMENT